This project implements defect detection in semiconductor SEM images of flat, linear and patterned structures using Fast MCD method
-
Updated
Jul 11, 2025 - Python
This project implements defect detection in semiconductor SEM images of flat, linear and patterned structures using Fast MCD method
Add a description, image, and links to the fast-mcd topic page so that developers can more easily learn about it.
To associate your repository with the fast-mcd topic, visit your repo's landing page and select "manage topics."